Showing results: 346 - 360 of 1675 items found.
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IST Engineering, INC.
With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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Eltel Industries
*ARM 9 processor controlled measurements*Measures total burden connected to test sample*Internal data storage facility upto 1 lakh readings*Digital display of test results on 800 x 480 TFT color display.*Latest IEC 61869 / ANSI C57.13-2008 / IS-2705 standards incorporated*VGA Port to interface with bigger display / monitor*Both Voltage & Current Transformer testing with one test set*5 and 1 Amp CT testing using either 5 or 1 Amp standard CT*Identifies ANSI, IEC, IS-P, IS-PR, BS, BS-S, IEC-S, IS, IS-S, AS, AS-M, AS-ME standards for CT & VT*USB memory storage*Available in three versions: AITTS Plus , ACTTS Plus & AVTTS Plus
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Shenzhen Chuangxin Instruments Co., Ltd.
The Universal Impact Hammer is designed to perform impact tests for product durability. The CX-T03 meets the testing needs of industry standards such as IEC 60065, 60335, 60598, 60601, 61010 and others. The hammer simulates mechanical impact to electronic products and electrical appliances. This impact hammer is versatile -- it can be dialed to a whole range of energy values to perform tests to many different standards. A compressed spring accelerates a hammer head to hit the sample undergoing test. The spring is released from a lock mechanism by pressing the cone-shaped top of the impact hammer against the product under test. The CX-T03 is adjustable from 0.2 Nm to 1 Nm by turning a ring on the hammer.
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PacketExpert™ -
GL Communications Inc.
PacketExpert™ 10GX is a comprehensive Ethernet/IP test solution supporting industry standard functionalities including wirespeed bit error rate testing (BERT), RFC 2544 / Y.1564 / RFC 6349 tests, packet capture, event-driven triggers and actions, traffic playback, impairment generation, stacked VLAN/MPLS tests, and many others.
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CZKS-4 -
Shenzhen Chuangxin Instruments Co., Ltd.
1. This test equipment is designed and manufactured according relevant requirement of Standard IEC60884-1,GB2099.1 and GB16915.1,Mainly used to test the service life of household and similar use plugs and sockets or switches. 2. This machine connect to load cabinet and conduct electrical life test ,normal operation and breaking capacity to plug socket and switch.
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Associated Environmental Systems
Associated Environmental Systems (AES) designs and manufactures standard and customized environmental test chambers. Our products vary in size from small bench top test chambers to very large walk-in environmental rooms. Whether you are looking for off-the-shelf or unique test chamber solution, we can meet your needs.
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SCR ELEKTRONIKS
The Ball Pressure Apparatus is designed to perform test specified in IS Standard where resistance of insulating material to elevated operating temperature is to be determined. It is used to test insulation materials used in Electrical Appliances, Electrical wiring accessories, luminaries, motors, connectors, etc. It is a precision engineered test instrument for use by safety and compliance testing laboratories.
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CF test 222 -
Sycard Technology
The CF test 222 socket tester provides a quick and easy way of verifying the operation of a CompactFlash™ host socket. Housed in a standard 3.3mm CompactFlash™ card, the CF test is fully self-contained. The CF test socket tester verifies all signals on the CompactFlash™ interface including accurate Vcc measurements.
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CF test 220 -
Sycard Technology
The CF test 220 socket tester provides a quick and easy way of verifying the operation of a CompactFlash™ host socket. Housed in a standard 3.3mm CompactFlash™ card, the CF test is fully self-contained. The CF test socket tester verifies all signals on the CompactFlash™ interface including accurate Vcc measurements.
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1000 Series ATE -
Circuit Check, Inc.
The Circuit Check 1000 Series ATE provides a configurable standard platform that can utilize multiple mass interconnect interfaces while providing ease of maintenance and the ability to accept a wide variety of test fixture solutions. With the 1000 Series ATE, test procedures become automatic, with test steps and go/no-go limits easily programmable.
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Sanwa Electric Instrument Co., Ltd
Test tool used to measure two or more electrical values—principally voltage (volts), current (amps) and resistance (ohms). It is a standard diagnostic tool for technicians in the electrical/electronic industries.
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Guangzhou Hanker Electronics Technology Co., Ltd
Is a test tool used to measure two or more electrical values—principally voltage (volts), current (amps) and resistance (ohms). It is a standard diagnostic tool for technicians in the electrical/electronic industries.
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DMM -
Greenlee Tools
Is a test tool used to measure two or more electrical values—principally voltage (volts), current (amps) and resistance (ohms). It is a standard diagnostic tool for technicians in the electrical/electronic industries.
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Vettiner
High accuracy Schering bridge for the measurement of capacitance and dielectric dissipation factor (tan d) for the characterization of dielectric insulators, calibration of standards and manufacturing test of all industrial equipment.
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ICS Electronics
All of ICS's Ethernet Interfaces conform to the IEEE-488.2 Standard and are fully VXI-11 compatible. Use with any Etherrnet based test system. Complies with LXI VXI Discovery method.